Integrated Test & Measurement iTestSystem

Integrated Test & Measurement's latest version of iTestSystem includes support for additional data acquisition hardware along with advanced event triggering functionality.

I T Sw Multi Daq

Integrated Test & Measurement (ITM) announces the latest release of its software platform, iTestSystem. 

  • Specifically designed for use with National Instruments (NI) cDAQ hardware
  • Enables test engineers to organize, acquire, view and analyze important engineering data
  • Enhancements include support for additional data acquisition hardware along with advanced event triggering functionality
  • Allows engineers to collect, analyze and trend data from sensors connected to their products and processes, enabling them to predict failures, evaluate operating conditions and determine vibration levels
  • Includes automated data collection/trending
  • Expanded data acquisition hardware support
  • Provides automated data analysis
  • Enhanced tools for data viewing and analysis
  • New data management and email notification services
  • Advanced triggering feature in MultiDAQ (iTestSystem’s data acquisition application) helps ensure comprehensive data collection
  • MultiDAQ is configured to collect data at regular intervals
  • Triggering of data capture when certain conditions are met and only during times when the system is active ensures anomalies and other key events are captured and made available without wasting disk space
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